DocumentCode :
1845215
Title :
Vector Corrected Harmonic Measurement of High Power Transistors
Author :
Pattison, L. ; Greer, A ; Linton, D. ; Patterson, A.D. ; Leckey, J.G.
Author_Institution :
The Department of Electrical and Electronic Engineering, The Queen¿s University of Belfast, Ashby Building, Stranmillis Road, Belfast, BT9 5AH, N. Ireland, Tel: +44 +(0) 1232 274089, Fax +44 +(0)1232 667023, e-mail: lyndon.pattison@ee.qub.ac.uk
Volume :
33
fYear :
1998
fDate :
35947
Firstpage :
26
Lastpage :
31
Abstract :
A large signal measurement system for characterisation of high power packaged devices has been developed. The system is based upon the Microwave Transition Analyser (HP 78002) integrated with a novel test jig which has been developed `in-house¿. The measurement system is fully vector corrected to the device planes and allows measurement of the magnitude and phase of the output harmonics under different drive levels, dc bias conditions, fundamental load impedance and frequency. Measured results are shown for a 4W Bipolar device.
Keywords :
Calibration; Electromagnetic heating; Microwave devices; Packaging; Power measurement; Power system harmonics; Power transistors; Scattering parameters; Switches; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Spring, 51st
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1998.327274
Filename :
4119963
Link To Document :
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