• DocumentCode
    1845223
  • Title

    Photon budget analysis for a novel fluorescence lifetime imaging microscopy system with a modulated electron-multiplied all-solid-state camera

  • Author

    Zhao, Q. ; Young, I.T. ; de Jong, J.G.S.

  • Author_Institution
    Dept. of Imaging Sci. & Technol., Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2009
  • fDate
    18-21 Oct. 2009
  • Firstpage
    104
  • Lastpage
    107
  • Abstract
    In this paper, a novel fluorescence lifetime imaging microscopy system is proposed that uses a modulated, electron-multiplied, all-solid-state camera (MEM-FLIM). This camera will eliminate the need for an image intensifier through the use of an application-specific charge coupled device (CCD) design. We are designing and building a CCD image sensor that can be modulated at the pixel level and that will have an electron multiplication feature to provide high sensitivity at low-light levels. The proposed design has advantages such as better signal-to-noise ratio (SNR), less geometric distortion, better resolution and low cost. It will be employed in both fluorescence lifetime imaging microscopy (FLIM) and, hopefully, in other biological and medical applications. We describe here the characteristic of our system and present a photon budget analysis for MEM-FLIM. This photon budget is important in order to understand the constraints which will be encountered in design and fabrication of our system.
  • Keywords
    CCD image sensors; biomedical optical imaging; fluorescence; CCD image sensor; MEM-FLIM; charge coupled device; electron multiplied all solid state camera; fluorescence lifetime imaging microscopy; geometric distortion; image intensifier; photon budget analysis; Photonics; charge coupled device (CCD); modulated electron-multiplied all-solid-state camera for fluorescence lifetime imaging microscopy (MEM-FLIM); photon budget; signal-to-noise ratio (SNR);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Molecular Medicine and Engineering (NANOMED), 2009 IEEE International Conference on
  • Conference_Location
    Tainan
  • Print_ISBN
    978-1-4244-5528-7
  • Type

    conf

  • DOI
    10.1109/NANOMED.2009.5559108
  • Filename
    5559108