DocumentCode
1845237
Title
Analysis of electric field distribution in cavities within solid dielectric materials
Author
Ghourab, M.E. ; El-Makkawy, S.M.
Author_Institution
Dept. of Electr. Eng., Suez-Canal Univ., Port-Said, Egypt
fYear
1994
fDate
23-26 Oct 1994
Firstpage
155
Lastpage
160
Abstract
In this paper, the charge simulation method (CSM) is used to calculate the maximum field stress and the electric field distribution within spherical voids embedded within a solid dielectric material. The effect of number and size of voids, electrode spacing, permittivity and void orientation on the electric field is studied as well
Keywords
voids (solid); cavities; charge simulation method; electric field distribution; field stress; solid dielectric materials; spherical voids; Boundary conditions; Computational modeling; Design engineering; Dielectric materials; Dielectrics and electrical insulation; Equations; Gases; Solids; Stress; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on
Conference_Location
Arlington, TX
Print_ISBN
0-7803-1950-8
Type
conf
DOI
10.1109/CEIDP.1994.591735
Filename
591735
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