DocumentCode :
1845276
Title :
The thermal-step-technique applied to the study of charge in an ordered structure material: single-crystal quartz
Author :
Agnel, S. ; Toureille, A.
Author_Institution :
Lab. d´´Electron. de Montpellier, Univ. des Sci. et Tech. du Languedoc, Montpellier, France
fYear :
1994
fDate :
23-26 Oct 1994
Firstpage :
177
Lastpage :
182
Abstract :
The interest of this study concerns the physics of space charge, In fact, a lot of electrical phenomena (dielectric rigidity, conduction, stocking of charges), mechanical phenomena (mechanical breakdown, grain boundaries), thermal phenomena (specific heat, diffusivity, conduction) seem to be linked to the space charge presence in these materials. In this article, after recalling the principle of space charge measurement elaborated and used in the Electrotechnics Laboratory of Montpellier, we discuss measurement results obtained on single-crystal quartz samples using the thermal-step method
Keywords :
quartz; SiO2; dielectric rigidity; mechanical phenomena; residual electric field; single-crystal quartz; space charge density; space charge measurement; thermal expansion current; thermal phenomena; thermal-step method; Charge measurement; Conducting materials; Current measurement; Dielectric breakdown; Grain boundaries; Physics; Resistance heating; Space charge; Space heating; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
0-7803-1950-8
Type :
conf
DOI :
10.1109/CEIDP.1994.591738
Filename :
591738
Link To Document :
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