Title :
High temperature, high reliability integrated hybrid packaging for radiation hardened spacecraft micromachined tunneling accelerometer
Author :
Boyadzhyan, Victor ; Choma, John, Jr.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
This paper summarizes and reports a radiation hardened spacecraft high temperature, high reliability sensor/circuit integrated packaging technology, Tunneling accelerometer integrated circuitry is the first flight-ready demonstration of electronics hybrid packaging as part of electron tunneling sensor. It is a radiation hardened spacecraft MCM IC technology/packaging to operate at elevated temperatures in a 100 krad (Si) environment. The circuit with the sensor is the first microelectromechanical system (MEMS) based on electron tunneling principal in a flight qualified integrated hybrid packaging form. Circuit guarantees automatic tunneling by adjusting tunneling gap (~10 angstroms) with minimum power consumption
Keywords :
accelerometers; hybrid integrated circuits; integrated circuit packaging; integrated circuit reliability; microsensors; multichip modules; space vehicle electronics; tunnelling; 100 krad; IC packaging; MCM; electron tunneling sensor; hybrid packaging; microelectromechanical system; micromachined tunneling accelerometer; power consumption; radiation hardened spacecraft electronics; reliability; Electronics packaging; Electrons; Integrated circuit packaging; Integrated circuit reliability; Integrated circuit technology; Radiation hardening; Space technology; Space vehicles; Temperature sensors; Tunneling;
Conference_Titel :
Integrated Power Packaging, 1998. IWIPP. Proceedings., IEEE International Workshop on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-5033-2
DOI :
10.1109/IWIPP.1998.722312