Title :
The Thermal-Step-Technique applied to the study of charge decay in a film of polypropylene
Author :
Enrici, P. ; Popiel, L. ; Reboul, J.P. ; Toureille, A.
Author_Institution :
Lab. d´´Electron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
Abstract :
The measurement of space charge location in insulating materials is necessary to know the residual electric field inside thick samples. So we have studied conduction phenomena and electric behaviour of these materials. The Thermal Step (T.S.) technique has been already used to measure the remaining electric field and space charge in polymers slabs in the thickness range 0.5 mm to 20 mm. In this work, we have extended this method to thin films. We have increased the speed of step and the acquisition. We present the results on 12 μm polypropylene films. The applications concern power capacitors and interface contact problems (AL/PP)
Keywords :
dielectric measurement; AL/PP interface contact; charge decay; conduction; insulating materials; polymers; polypropylene; power capacitors; residual electric field; space charge measurement; thermal step technique; thin films; Charge measurement; Conducting materials; Current measurement; Dielectrics and electrical insulation; Electric variables measurement; Polymer films; Power capacitors; Slabs; Space charge; Thickness measurement;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
0-7803-1950-8
DOI :
10.1109/CEIDP.1994.591740
