• DocumentCode
    1845373
  • Title

    Aging diagnostics of power transmission cable insulation by fluorescence techniques

  • Author

    Wu, F.M. ; Kulawansa, D.M. ; Solonenko, M. ; Hatfield, L.L. ; Menzel, E.R.

  • Author_Institution
    Dept. of Phys., Texas Tech. Univ., Lubbock, TX, USA
  • fYear
    1994
  • fDate
    23-26 Oct 1994
  • Firstpage
    206
  • Lastpage
    215
  • Abstract
    A number of spectroscopic investigations have been conducted on Conductor Products, Inc. Distribution cable, with cross-linked polyethylene as the insulation, subjected to accelerated aging tests. The principal finding of the study is that measurement of the ratio of XLPE inherent fluorescence at 580 and 650 nm, under 514.5 nm Ar-laser excitation, provides a means of determining remaining cable life. Penetration profiles of fluorescent dyes show promise in this diagnostic effort as well. Other fluorescence studies, such as bow-tie tree examination, although potentially useful in elucidation of aging processes, were not found useful in remaining cable life diagnostics. Service-aged sample, albeit necessarily few, have been examined. The emerging trend is that low fluorescence ratio and/or high fluorescence intensity are associated with long service life. The opposite is found for cables that have failed quickly. To firm up this trend, extensive data bases will be needed. Samples of ethylene propylene rubber cables have been examined. Substantial fluorescence changes occur on aging. A study akin to that performed for XLPE is called for
  • Keywords
    power cable insulation; 580 nm; 650 nm; Ar-laser excitation; accelerated aging; bow-tie tree; cross-linked polyethylene; diagnostics; dye penetration profiles; ethylene propylene rubber; fluorescence spectroscopy; power transmission cable insulation; service life; Accelerated aging; Cable insulation; Conductors; Fluorescence; Insulation testing; Polyethylene; Power cable insulation; Power cables; Power transmission; Spectroscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on
  • Conference_Location
    Arlington, TX
  • Print_ISBN
    0-7803-1950-8
  • Type

    conf

  • DOI
    10.1109/CEIDP.1994.591743
  • Filename
    591743