Title :
In-Line Multiport Calibration
Author :
Williams, Dylan F. ; Walker, David K.
Author_Institution :
National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80303, Ph: [+1] (303)497-3138 Fax: [+1] (303)497-3122 E-mail: dylan@boulder.nist.gov
Abstract :
We present a multiport measurement procedure well suited to on-wafer measurement. It can correct multiport measurements with any conventional in-line calibration, including the thru-reflect-line calibration. We demonstrate the procedure in a four-port measurement system.
Keywords :
Calibration; Coplanar waveguides; Frequency; Impedance measurement; Measurement standards; NIST; Probes; Signal analysis; Switches; Transmission line matrix methods;
Conference_Titel :
ARFTG Conference Digest-Spring, 51st
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1998.327284
