Title :
Some consideration for obtaining the low frequency response of dielectrics from absorption current measurements
Author :
Li, H.M. ; Fouracre, R.A. ; Crichton, B.H.
Author_Institution :
Dept. of Electron. & Electr. Eng., Strathclyde Univ., Glasgow, UK
Abstract :
In this paper, the relationship between the frequency and time domain windows is discussed and an approach is introduced which allows the response to an infinite excitation (charging) process to be derived from the measurement of the response to a fixed period of excitation. As an example, the measurement of absorption currents and their transformation to the frequency domain are discussed using a polyethersulphone (PES) thin film sample
Keywords :
organic insulating materials; 1E-6 to 0.1 Hz; absorption current measurements; frequency domain windows; infinite excitation process; insulating materials; low frequency response; polyethersulphone thin film; time domain windows; Absorption; Current measurement; Dielectric measurements; Equations; Frequency domain analysis; Frequency measurement; Frequency response; Permittivity measurement; Time measurement; Velocity measurement;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
0-7803-1950-8
DOI :
10.1109/CEIDP.1994.591748
