DocumentCode
1845558
Title
Close-In Phase Noise Measurements of Injection Locked Oscillators
Author
Rodriguez, Alberto ; Dunleavy, Lawrence P. ; Weller, Thomas M.
Author_Institution
Wireless and Microwave Program, Department of Electrical Engineering, University of South Florida, 4202 E. Fowler Ave., ENB118, Tampa, FL 33620, www.eng.usf.edu/WAMI
Volume
33
fYear
1998
fDate
35947
Firstpage
121
Lastpage
130
Abstract
Independent implementation and verification is described for a published injection locking approach to close-in phase noise measurements. Experimentation was conducted to study the sensitivity of the measured results to various parameters within the system, including oscillator-under-test power level, and the need for an isolator in the test system. The results show that the phase noise measurement is relatively robust to power level variations within the system, and that the isolator, although bandwidth limiting, does perform a necessary role for the measurement. A pair of 1.4GHz free running oscillators are used as test cases in this study. Measurements from the injection locking technique are compared to those made using the more traditional detector and discriminator methods.
Keywords
Bandwidth; Injection-locked oscillators; Isolators; Noise measurement; Noise robustness; Performance evaluation; Phase measurement; Phase noise; Power measurement; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Spring, 51st
Conference_Location
Baltimore, MD, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1998.327289
Filename
4119978
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