Title :
Sigma-delta learning for super-resolution independent component analysis
Author :
Fazel, Amin ; Chakrabartty, Shantanu
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI
Abstract :
Many source separation algorithms fail to deliver robust performance in presence of artifacts introduced by cross-channel redundancy, non-homogeneous mixing and high- dimensionality of the input signal space. In this paper, we propose a novel framework that overcomes these limitations by integrating learning algorithms directly with the process of signal acquisition and sampling. At the core of the proposed approach is a novel regularized max-min optimization approach that yields "sigma-delta" limit-cycles. An on-line adaptation modulates the limit-cycles to enhance resolution in the signal sub- spaces containing non-redundant information. Numerical experiments simulating near-singular and non-homogeneous recording conditions demonstrate consistent improvements of the proposed algorithm over a benchmark when applied for independent component analysis (ICA).
Keywords :
independent component analysis; minimisation; signal detection; signal resolution; signal sampling; source separation; max-min optimization; resolution enhancement; sigma-delta learning; signal acquisition; signal sampling; source separation algorithms; super-resolution independent component analysis; Analytical models; Delta-sigma modulation; Independent component analysis; Limit-cycles; Numerical simulation; Robustness; Signal processing; Signal resolution; Signal sampling; Source separation;
Conference_Titel :
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-1683-7
Electronic_ISBN :
978-1-4244-1684-4
DOI :
10.1109/ISCAS.2008.4542088