• DocumentCode
    1845650
  • Title

    Computation of space charge-induced terminal current

  • Author

    Boggs, Steven A. ; Kuang, Jinbo

  • Author_Institution
    Dept. of Electr. Eng., Toronto Univ., Ont., Canada
  • fYear
    1994
  • fDate
    23-26 Oct 1994
  • Firstpage
    292
  • Lastpage
    297
  • Abstract
    Space charge induced phenomena in microscopic volumes can be studied through measurement of the space charge-induced terminal current using techniques which cancel the displacement current. The first order computation of such phenomena requires iterative solution for the electric field and related parameters with time-dependent voltage and field-dependent conductivity. Solutions have been published for 1-dimensional configurations (coaxial cylinders and concentric spheres) and for two-dimensional configurations. Various techniques are employed to solve for the current density, charge density, potential or field distribution, etc. as a function of time. The combination of a current density and a field implies dissipation which, in turn, implies a resistive terminal current. This resistive terminal current is presently the only measurable diagnostic for the field-induced phenomena which take place in the microscopic region surrounding a defect. Methods for computing this terminal current are, therefore, crucial to theoretical investigation of defect-induced space charge phenomena and are the subject of this contribution
  • Keywords
    space charge; charge density; current density; field distribution; field-induced phenomena; iterative solution; microscopic volumes; one-dimensional configurations; resistive terminal current; space charge-induced terminal current; two-dimensional configurations; Charge measurement; Conductivity; Current density; Current measurement; Displacement measurement; Extraterrestrial phenomena; Microscopy; Space charge; Voltage; Volume measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on
  • Conference_Location
    Arlington, TX
  • Print_ISBN
    0-7803-1950-8
  • Type

    conf

  • DOI
    10.1109/CEIDP.1994.591757
  • Filename
    591757