Title :
Convergence analyses of simulated evolution algorithms
Author :
Mao, Chi-Yu ; Hu, Yu Hen
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
Abstract :
In this paper, we show that simulated evolution (SE) can be modeled by an ergodic Markov chain. As such, the global convergence of the SE algorithm is established. Moreover, we propose to use the mean first visit time of an ergodic Markov chain to characterize the convergence time of the SE algorithm such that the fast convergence feature of SE can be assessed theoretically and experimentally
Keywords :
Markov processes; VLSI; circuit layout CAD; convergence; stochastic programming; 1D gate permutation problem; VLSI design; combinatorial stochastic optimization; convergence time; ergodic Markov chain; global convergence; mean first visit time; simulated evolution algorithms; state transition probability; Algorithm design and analysis; Analytical models; Buildings; Computational modeling; Computer simulation; Convergence; Cost function; Design optimization; Stochastic processes; Very large scale integration;
Conference_Titel :
VLSI, 1994. Design Automation of High Performance VLSI Systems. GLSV '94, Proceedings., Fourth Great Lakes Symposium on
Conference_Location :
Notre Dame, IN
Print_ISBN :
0-8186-5610-7
DOI :
10.1109/GLSV.1994.290000
