Title :
Dielectric spectroscopy of epoxy based insulation systems aged under functional electrical and thermal conditions
Author :
Rieux, N. ; Pouilles, V. ; Lebey, T.
Author_Institution :
Alcatel Alsthom Recherche, Marcoussis, France
Abstract :
The work described was designed to understand the physical mechanisms of aging. New applications of power electronics modify electrical aging conditions and can increase the risk of insulation failures. An experimental aging study has been performed on epoxy based sheets. Electrical aging conditions are constituted by repetitive pulses. The repetition rate is adjustable from a few Hertz to 15 kHz and rise time can be changed from 500 V/μs to 5 kV/μs. The generator is associated with on oven which allows us to combine thermal and electrical aging reproducing real functional conditions. A dielectric spectroscopy measurement method has been used to follow insulation degradation. The results obtained con be interpreted by a Cole-Cole diagram and associated theories. Good agreement is found between the frequency shift of the resonant loss peak and aging
Keywords :
epoxy insulation; 20 Hz to 300 kHz; 20 to 120 C; Cole-Cole diagram; dielectric spectroscopy; electrical aging; epoxy based insulation systems; epoxy based sheets; functional conditions; glass fibre reinforced epoxy; insulation degradation; physical aging mechanisms; power electronics stress; relaxation peak; repetitive pulses; resonant loss peak; rise time; thermal aging; Aging; Dielectric measurements; Dielectrics and electrical insulation; Electrochemical impedance spectroscopy; Frequency; Glass; Ovens; Power electronics; Stress; Temperature distribution;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
0-7803-1950-8
DOI :
10.1109/CEIDP.1994.591774
