DocumentCode
1845973
Title
Diagnostic of High Speed Analog Circuits using DC conditions
Author
C. A., Gracios Marin ; L.A., Sarmiento Reyes
Author_Institution
I.T.V. - I.N.A.O.E., Puebla. Pue. MEXICO, cgracios@inaoep.mx
Volume
34
fYear
1998
fDate
Dec. 1998
Firstpage
55
Lastpage
58
Abstract
This paper focusses the attention on the problem of analog nonlinear circuits diagnostic when a circuit with multiple DC solutions has a fault in any element and the possibility to locate the fault in the circuit is complicated due to change in the number of solutions. Several improvements are tried to include in [1] with the gain to use differents models in the electronic devices like diodes, bipolar or MOS transistors and it let to observe how the analysis changes when the designer uses a simple model
Keywords
Analog circuits; Circuit faults; Circuit testing; Diodes; Electronic equipment testing; Equations; High-speed electronics; MOSFETs; Nonlinear circuits; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Fall, 52nd
Conference_Location
Rohnert Park, CA, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1998.327315
Filename
4120000
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