Title :
A New Two Temperatures Noise Model for FET Mixers Suitable for CAD
Author :
Danneville, F. ; Fan, S. ; Tamen, B. ; Dambrine, Gilles ; Cappy, A.
Author_Institution :
IEMN, UMR CNRS 9929, Cite Scientifique, Avenue Poincare-BP 69,59652 Villeneuve d´´Ascq Cedex-France; HP EEs y, HP EEsof Division, 1400 Fountaingrove Parkway, MS 2USQ, Santa of Division, Santa Rosa, phone number: 707 577 3505, fax number: 707 577 3948, e-m
Abstract :
In this paper, we propose a simple and accurate new model for determining the noise correlation matrix of FETs for mixer applications. Using this nonlinear noise model, and by a judicious choice of the terminations value present at each flequency, it is shown that the noise figure of FET mixers can be greatly improved. HP EEsof and IEMN are investigating incorporating the model into HP EEsof´s products so as to widely increase its availability.
Keywords :
Active noise reduction; FETs; Frequency; Mixers; Noise figure; Noise measurement; Signal analysis; Temperature; Tin; Voltage;
Conference_Titel :
ARFTG Conference Digest-Fall, 52nd
Conference_Location :
Rohnert Park, CA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1998.327316
