Title :
Effect of surface asperity truncation on thermal contact conductance
Author :
Milanez, Fernando H. ; Yovanovich, M.M. ; Culham, J.R.
Author_Institution :
Dept. of Mech. Eng., Waterloo Univ., Ont., Canada
Abstract :
This paper presents studies on thermal contact conductance at light contact loads. Surface profilometry measurements are presented which show that actual surface asperity height distributions are not perfectly Gaussian. The highest asperities are truncated, leading the existing thermal contact conductance models to underpredict experimental data. These observations have been incorporated into modifications of existing contact conductance models. The preliminary model has been compared against thermal contact conductance data presented in the open literature, and good agreement is observed. The truncation leads to an enhancement of thermal contact conductance at light contact pressures. The truncation is a function of the roughness level: the rougher the surface, the more truncated the surface height distribution.
Keywords :
Gaussian distribution; packaging; statistical analysis; surface topography; thermal analysis; thermal conductivity; thermal resistance; contact conductance models; light contact loads; light contact pressures; roughness level; surface asperity height distributions; surface asperity truncation; surface profilometry measurements; thermal contact conductance data; Deformable models; Heat transfer; Microelectronics; Predictive models; Rough surfaces; Solid modeling; Surface roughness; Thermal conductivity; Thermal engineering; Thermal loading;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 2002. ITHERM 2002. The Eighth Intersociety Conference on
Print_ISBN :
0-7803-7152-6
DOI :
10.1109/ITHERM.2002.1012456