• DocumentCode
    1846170
  • Title

    Extending Microarray Quality Control and Analysis Algorithms to Illumina Chip Platform

  • Author

    Stokes, T.H. ; Xiao Han ; Moffitt, R.A. ; Wang, M.D.

  • Author_Institution
    Georgia Inst. of Technol., Atlanta
  • fYear
    2007
  • fDate
    22-26 Aug. 2007
  • Firstpage
    4637
  • Lastpage
    4640
  • Abstract
    This paper presents a novel data quality control technique for a challenging new microarray platform supplied by Illumina, Inc. Microarray is a revolutionary biotechnology that enables the study of thousands of genes and proteins simultaneously. While the type of microarray chip platforms keeps increasing and the manufacture quality keeps improving, the array data quality control and analysis tools are still lagging behind. In this research, we design an adaptable microarray data quality control and analysis system capable of handling multiple microarray platforms. We demonstrate that the Illumina chips, even though the layouts are randomly assembled, still contain artifacts. We conclude that it is necessary for chip manufacturers to provide low-level bead location output as a standard feature for better data quality assurance.
  • Keywords
    biochemistry; biology computing; biotechnology; data analysis; genetics; lab-on-a-chip; molecular biophysics; proteins; Illumina chip platform; genes; microarray analysis algorithms; microarray quality control; proteins; revolutionary biotechnology; Algorithm design and analysis; Biomedical computing; Biomedical engineering; Control system analysis; Manufacturing; Probes; Quality assurance; Quality control; Reproducibility of results; Testing; Artifact Removal; Illumina Microarray; Quality Control; Computer Simulation; Gene Expression Profiling; Gene Expression Regulation; Oligonucleotide Array Sequence Analysis; Random Allocation; Selection Bias; Sensitivity and Specificity; Software;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
  • Conference_Location
    Lyon
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-0787-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.2007.4353373
  • Filename
    4353373