DocumentCode
1846170
Title
Extending Microarray Quality Control and Analysis Algorithms to Illumina Chip Platform
Author
Stokes, T.H. ; Xiao Han ; Moffitt, R.A. ; Wang, M.D.
Author_Institution
Georgia Inst. of Technol., Atlanta
fYear
2007
fDate
22-26 Aug. 2007
Firstpage
4637
Lastpage
4640
Abstract
This paper presents a novel data quality control technique for a challenging new microarray platform supplied by Illumina, Inc. Microarray is a revolutionary biotechnology that enables the study of thousands of genes and proteins simultaneously. While the type of microarray chip platforms keeps increasing and the manufacture quality keeps improving, the array data quality control and analysis tools are still lagging behind. In this research, we design an adaptable microarray data quality control and analysis system capable of handling multiple microarray platforms. We demonstrate that the Illumina chips, even though the layouts are randomly assembled, still contain artifacts. We conclude that it is necessary for chip manufacturers to provide low-level bead location output as a standard feature for better data quality assurance.
Keywords
biochemistry; biology computing; biotechnology; data analysis; genetics; lab-on-a-chip; molecular biophysics; proteins; Illumina chip platform; genes; microarray analysis algorithms; microarray quality control; proteins; revolutionary biotechnology; Algorithm design and analysis; Biomedical computing; Biomedical engineering; Control system analysis; Manufacturing; Probes; Quality assurance; Quality control; Reproducibility of results; Testing; Artifact Removal; Illumina Microarray; Quality Control; Computer Simulation; Gene Expression Profiling; Gene Expression Regulation; Oligonucleotide Array Sequence Analysis; Random Allocation; Selection Bias; Sensitivity and Specificity; Software;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
Conference_Location
Lyon
ISSN
1557-170X
Print_ISBN
978-1-4244-0787-3
Type
conf
DOI
10.1109/IEMBS.2007.4353373
Filename
4353373
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