Proposed chapter 9 for predicting voltage sags (dips) in revision to IEEE Std 493, the Gold Book

Author

Becker, Carl ; Braun, William, Jr. ; Carrick, Kenneth ; Diliberti, Tom ; Grigg, Cliff ; Groesch, Joe ; Hazen, Bill ; Imel, Tom ; Koval, Don ; MUELLER, David ; John, Tony Saint ; Conrad, Larry E.

fYear

1993

fDate

2-6 May 1993

Firstpage

43

Lastpage

51

Abstract

Voltage sags, also known as dips, are increasingly important to industrial reliability. Modern process controls are often sensitive to voltage sags. The combination of a voltage sag and sensitive equipment may cause significant production outages. Less sensitive equipment may be available at a premium price, but the designer must know the sag characteristics of the electric system to make the best choices between reliability and cost. This proposed chapter offers a way to predict voltage sag performance without long term monitoring and before plants are constructed. The analysis technique proposed for a new chapter 9 in the next revision of IEEE std 493 is shown.<>

Keywords

electrical faults; power system reliability; standards; Gold Book; IEEE Std 493; electric system; fault clearing; industrial reliability; proposed chapter 9; voltage dips; voltage sags prediction; Books; Circuit analysis computing; Circuit faults; Electronics packaging; Gold; Power quality; Power system reliability; Production; Substations; Voltage fluctuations;

fLanguage

English

Publisher

ieee

Conference_Titel

Industrial and Commercial Power Systems Technical Conference, 1993. Conference Record, Papers Presented at the 1993 Annual Meeting

Conference_Location

St. Petersburg, FL, USA

Print_ISBN

0-7803-0937-5

Type

conf

DOI

10.1109/ICPS.1993.290589

Filename

290589