Title :
Measuring the Characteristics of Modulated Non-Linear Devices
Author :
Rolain, Yves ; van Moer, Wendy ; Vael, Philip
Author_Institution :
Vrije Universiteit Brussel - Dept. ELEC/TW Pleinlaan, 2 B-1050 Brussel Phone: +32.2.629.29.44, Fax: +32.2.629.28.50, Email: Yves.Rolain@vub.ac.be
Abstract :
A flexible and reconfigurable measurement setup for non-linear devices is proposed. It combines the advantages of a reconfigurable instrument and interchangeability of the instrumentation modules. To show the framework capability, the non-linear characterisation of an amplifier in the 900 MHz band under cw and modulated excitation is presented. The spectral regrowth is hereby fully characterised in amplitude and phase.
Keywords :
Data processing; Distortion measurement; Frequency; Gain measurement; Impedance; Instruments; Performance evaluation; Phase measurement; Power measurement; Relational databases;
Conference_Titel :
ARFTG Conference Digest-Spring, 53rd
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1999.327339
