Development of Pulsed-RF Measurement Techniques from 50-110 GHz

On-wafer Pulsed-RF calibrations and measurements are achieved for the first time at millimeter-wave frequencies (50-110 GHz). The system is calibrated at different duty cycles and pulse width conditions using Line-Reflect-Match (LRM) to test its dynamic range. Additionally, four different GaAs PHEMT discrete samples are tested under both pulse-RF and Continuous Mode Operations (50-75 GHz) and measurement trends are verified with actual lower frequency (2-20 GHz) Pulsed-RF measurements under the same conditions. This fully operational Pulsed-RF system (50-110GHz) paralleled with a pulsed IV-system will provide more complete information for device modeling as well as device operation outside the device Continuous Safe Operating Area (SOA)