DocumentCode :
1846770
Title :
Asynchronous balanced gates tolerant to interconnect variability
Author :
Kulikowski, Konrad J. ; Venkataraman, Vyas ; Wang, Zhen ; Taubin, Alexander ; Karpovsky, Mark
Author_Institution :
Reliable Comput. Lab., Boston Univ., Boston, MA
fYear :
2008
fDate :
18-21 May 2008
Firstpage :
3190
Lastpage :
3193
Abstract :
Existing methods for gate level power attack countermeasures depend on exact capacitance matching of the dual-rail data outputs of each gate. Process variability and a lack of design tools make this requirement very difficult to satisfy in practice. We present a novel asynchronous dual-rail gate design which is power balanced, does not require capacitance matching of the data outputs, and is tolerant to process variability on the routed interconnect between gates.
Keywords :
asynchronous circuits; capacitance; integrated circuit design; integrated circuit interconnections; asynchronous balanced gates; asynchronous dual-rail gate design; capacitance matching; gate level power attack countermeasures; interconnect variability; Capacitance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-1683-7
Electronic_ISBN :
978-1-4244-1684-4
Type :
conf
DOI :
10.1109/ISCAS.2008.4542136
Filename :
4542136
Link To Document :
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