Title :
Optimization study of stacked micro-channel heat sinks for micro-electronic cooling
Author :
Wei, Xiaojin ; Joshi, Yogendra
Author_Institution :
George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
With smaller inlet flow velocity, a micro-channel stack requires less pumping power to remove a certain amount of heat than a single-layered micro-channel, because it provides a larger heat transfer area. A simple thermal resistance network model was developed to evaluate the overall thermal performance of a stacked micro-channel heat sink. Based on this simple model, in this study, a single objective minimization of overall thermal resistance is carried out using genetic algorithms. The aspect ratio, fin thickness and the ratio of channel width to fin thickness are the variables to be optimized, subject to constraints of maximum pressure drop (4 bar) and maximum volumetric flow rate (1000 ml/min). During the optimization, the overall dimensions, number of layers and pumping power (product of pressure drop and flow rate) are fixed. The study indicates that reduction in thermal resistance can be achieved by optimizing the channel configuration. The effects of number of layers in the stack, pumping power per unit area, and the channel length are investigated.
Keywords :
channel flow; cooling; genetic algorithms; heat sinks; minimisation; thermal management (packaging); thermal resistance; aspect ratio; channel configuration optimization; channel length; channel width to fin thickness ratio; fin thickness; genetic algorithms; heat transfer area; inlet flow velocity; maximum pressure drop; maximum volumetric flow rate; micro-electronic cooling; objective minimization; optimization study; overall thermal resistance; pumping power; stacked micro-channel heat sinks; thermal management; thermal performance; thermal resistance network model; Cooling; Heat pumps; Heat sinks; Heat transfer; Microchannel; Temperature; Thermal conductivity; Thermal factors; Thermal management; Thermal resistance;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 2002. ITHERM 2002. The Eighth Intersociety Conference on
Print_ISBN :
0-7803-7152-6
DOI :
10.1109/ITHERM.2002.1012490