DocumentCode :
1846949
Title :
An Efficient Global Search Algorithm For Test Generation
Author :
Yousif, A.-F. ; Jun Cu
Author_Institution :
University of Calgary
fYear :
1993
fDate :
3-6 May 1993
Firstpage :
1499
Lastpage :
1502
Keywords :
Automatic test pattern generation; Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; System testing; Test pattern generators; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
IEEE
Print_ISBN :
0-7803-1281-3
Type :
conf
Filename :
692942
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1846949
