Title :
Statistical physical noise behavior analysis of the time domain EMI measurement system
Author :
Krug, F. ; Mueller, D. ; Russer, P.
Author_Institution :
Lehrstuhl fur Hochfrequenztechnik, Tech. Univ. Munich, Germany
Abstract :
In this paper we analyse the statistical physical noise behavior of the broad-band time-domain electromagnetic interference measurement system. The digital signal processing of EMI measurements allows to emulate in real-time the various modes of conventional analogous equipment, e.g. peak-, average-, RMS- and quasi-peak- detector mode. Because the signals encountered in typical EMI measurement scenarios am of stochastic nature, a statistical physical noise analysis of the detector modes is necessary. The signal processing of white Gaussian noise and the measurement results obtained from the investigation of a DC/DC-converter obtained with the time-domain electromagnetic interference (TDEMI) measurement system are discussed.
Keywords :
Gaussian noise; analogue-digital conversion; discrete Fourier transforms; electromagnetic compatibility; electromagnetic interference; immunity testing; probability; signal sampling; time-domain analysis; white noise; ADC; DC-DC converter; DFT; Rayleigh distribution; broadband system; detector modes; digital signal processing; electromagnetic compatibility; equipment under test; probability density function; statistical physical noise behavior; time domain EMI measurement system; white Gaussian noise; Detectors; Digital signal processing; Electromagnetic analysis; Electromagnetic interference; Electromagnetic measurements; Noise measurement; Signal analysis; Stochastic resonance; Time domain analysis; Time measurement;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2003. IEEE
Conference_Location :
Columbus, OH, USA
Print_ISBN :
0-7803-7846-6
DOI :
10.1109/APS.2003.1219826
