• DocumentCode
    18471
  • Title

    Achieving High Performance Oxide TFT-Based Inverters by Use of Dual-Gate Configurations With Floating and Biased Secondary Gates

  • Author

    Man Ju Seok ; Mativenga, Mallory ; Di Geng ; Jin Jang

  • Author_Institution
    Dept. of Inf. Display, Kyung Hee Univ., Seoul, South Korea
  • Volume
    60
  • Issue
    11
  • fYear
    2013
  • fDate
    Nov. 2013
  • Firstpage
    3787
  • Lastpage
    3793
  • Abstract
    A dual-gate thin-film transistor (TFT) has two gate electrodes. In inverted, staggered TFTs, the primary gate is usually the bottom gate (BG) and the TFT´s threshold voltage (VTH) can be adjusted by applying a constant bias to the secondary gate, the top gate (TG), while scanning the BG. Dual-gate TFTs are being used as the load TFT in oxide semiconductor-based inverters, where the TG is biased positively to shift the VTH negatively and, thereby improving the inverter´s output swing. Here, we show that the same can be achieved by the use of a floating TG. Furthermore, we show that the noise margin of the inverter can also be controlled by adding a biased TG to the driving TFT.
  • Keywords
    field effect transistors; invertors; semiconductor device noise; thin film transistors; BG; TG; biased secondary gate; bottom gate; dual-gate thin-film transistor; floating secondary gate; high performance oxide TFT-based inverter; noise margin; semiconductor-based inverter; two gate electrode; Electrodes; Insulators; Inverters; Logic gates; Metals; Thin film transistors; Amorphous-indium-gallium-zinc-oxide (a-IGZO); depletion load; floating metal; inverter; thin-film transistor (TFT);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2013.2280912
  • Filename
    6605605