• DocumentCode
    1847246
  • Title

    Hidden Markov Multivariate Autoregressive (HMM-mAR) Modeling Framework for Surface Electromyography (sEMG) Data

  • Author

    Chiang, J. ; Wang, Z. Jane ; McKeown, M.J.

  • Author_Institution
    Univ. of British Columbia, Vancouver
  • fYear
    2007
  • fDate
    22-26 Aug. 2007
  • Firstpage
    4826
  • Lastpage
    4829
  • Abstract
    Surface electromyographic (sEMG) analysis is complicated by the fact that the data are inherently non- stationary. To deal with this and to determine muscle activity patterns during reaching movements, we proposed modeling sEMG with a hidden Markov model-multivariate autoregressive (HMM-mAR) framework. The classification between healthy and stroke subjects was performed using structural features extracted from HMM-mAR models. Both the raw and carrier data produced excellent classification performance. The proposed method represents a fundamental departure from most existing methods where only the amplitude is analyzed or the mAR coefficients are directly used for classification. In contrast, our analysis shows that structural features of the multivariate sEMG carrier data or the residuals after model fitting can enhance the classification of reaching movements.
  • Keywords
    autoregressive processes; electromyography; feature extraction; hidden Markov models; mechanoception; HMM-mAR; feature extraction; hidden Markov multivariate autoregressive model; muscle activity pattern; reaching movement; sEMG analysis; stroke; surface electromyography; Biomedical signal processing; Coherence; Covariance matrix; Data mining; Electromyography; Feature extraction; Hidden Markov models; Muscles; Surface fitting; Switches; Algorithms; Electromyography; Humans; Markov Chains; Models, Biological; Multivariate Analysis; Muscle Fatigue; Muscle, Skeletal; Reference Values; Regression Analysis; Stroke;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
  • Conference_Location
    Lyon
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-0787-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.2007.4353420
  • Filename
    4353420