DocumentCode :
1847423
Title :
Space charge injected via interfaces and tree initiation in polymers
Author :
Tanaka, Toshhtsu
Author_Institution :
CRIEPI, Tokyo, Japan
fYear :
2001
fDate :
2001
Firstpage :
1
Lastpage :
15
Abstract :
Space charge can be measured non-destructively as a standard practice now. It has been long suspected that space charge might be critically involved in local dielectric breakdown or tree initiation. It is widely accepted that space charge is formed under dc stress in dielectrics. The author demonstrated a hypothetical space charge-dominant model for tree initiation in 1979 in Japanese and in 1991 in English, and proposed that charge can be accumulated inside polymer dielectrics near the divergent high field region even under ac stress. The model consists of a charge injection and extraction process, a charge trapping and space-charge forming process, a polymer scission process due to high energy injected and extracted electrons, an oxidation process, an electric field enhancement process, and a tree initiation process. The author explains his hypothetical space charge dominant model for tree initiation, various relevant phenomena and data that could prove the validity of the model, tries to interpret several recently discovered phenomena with his model, and reevaluates it as compared with modern concepts for tree initiation
Keywords :
organic insulating materials; polymers; space charge; trees (electrical); charge trapping; dc stress; divergent high field region; electric field enhancement; electrical insulation; local dielectric breakdown; oxidation process; polymer dielectrics; polymer scission process; space charge; space charge-dominant model; space-charge forming process; tree initiation; Charge measurement; Current measurement; Data mining; Dielectric breakdown; Dielectric measurements; Electron traps; Measurement standards; Polymers; Space charge; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2001 Annual Report. Conference on
Conference_Location :
Kitchener, Ont.
Print_ISBN :
0-7803-7053-8
Type :
conf
DOI :
10.1109/CEIDP.2001.963477
Filename :
963477
Link To Document :
بازگشت