Title :
On The Resetability Of Synchronous Sequential Circuits
Author :
Lioy, Antonio ; Poncino, Massimo
Author_Institution :
Politecnico di Torino
Keywords :
Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Data structures; Hardware; Memory management; Sequential circuits; Upper bound;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
IEEE
Print_ISBN :
0-7803-1281-3