• DocumentCode
    1847563
  • Title

    Sources of Error in Coplanar-Waveguide TRL Calibrations

  • Author

    Kaiser, Raian F. ; Williams, Dylan F.

  • Author_Institution
    National Institute of Standards and Technology, 325 Broadway, Boulder CO 80303 Ph: [+1](303)497-5491 Fax: [+1](303)497-3122 E-mail: rkaiser@boulder.nist.gov
  • Volume
    36
  • fYear
    2000
  • fDate
    Dec. 2000
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper explores the impact of five sources of systematic error in coplanar-waveguide thru-reflect-line calibrations. We develop expressions that predict systematic measurement error and test them experimentally by deliberately introducing error into real measurement data.
  • Keywords
    Calibration; Coplanar waveguides; Frequency; Impedance; Measurement errors; NIST; Scattering parameters; System testing; Transmission line matrix methods; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 54th
  • Conference_Location
    Atlanta, GA, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1999.327367
  • Filename
    4120069
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1847563