Title :
Sources of Error in Coplanar-Waveguide TRL Calibrations
Author :
Kaiser, Raian F. ; Williams, Dylan F.
Author_Institution :
National Institute of Standards and Technology, 325 Broadway, Boulder CO 80303 Ph: [+1](303)497-5491 Fax: [+1](303)497-3122 E-mail: rkaiser@boulder.nist.gov
Abstract :
This paper explores the impact of five sources of systematic error in coplanar-waveguide thru-reflect-line calibrations. We develop expressions that predict systematic measurement error and test them experimentally by deliberately introducing error into real measurement data.
Keywords :
Calibration; Coplanar waveguides; Frequency; Impedance; Measurement errors; NIST; Scattering parameters; System testing; Transmission line matrix methods; Upper bound;
Conference_Titel :
ARFTG Conference Digest-Spring, 54th
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1999.327367
