Title :
Deriving Error Bounds on Measured Noise Factors Using Active Device Verification
Author :
Van den Bosch, Sven ; Martens, Luc
Author_Institution :
Department of Information technology, University of Gent, Sint-Pietersnieuwstraat 41, B-9000 Gent, Belgium.; Flemish Institute for the Promotion of the Scientific and Technological Research in Industry (IWT)
Abstract :
We have implemented an active device verification procedure for noise factor measurements into existing commercially available noise measurement software. The method was used for verifying GaAs MESFET noise factor measurements. Also, an approximation was developed, providing an error on the measured 50¿ noise factors.
Keywords :
Acoustic reflection; Active noise reduction; Calibration; Gallium arsenide; MESFETs; Measurement standards; Noise figure; Noise measurement; Power measurement; Transmission line measurements;
Conference_Titel :
ARFTG Conference Digest-Spring, 54th
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1999.327371
