Title :
A Novel De-embedding Technique for Millimeter-wave Package Characterization
Author :
Liang, Hongwei ; Laskar, Joy ; Hyslop, Mike ; Panicker, Ram
Author_Institution :
School of Electrical Engineering, Georgia Institute of Technology, 791, Atlantic Dr, N.W. Atlanta, GA 30332 (404)894-5174 Email: hwliang@ee.gatech.edu
Abstract :
This paper describes a novel de-embedding technique for millimeter-wave BGA package characterization using accurate 2-port measurement. By calculating the S-matrix of the discontinuity between the probes and the DUT, the procedure can overcome the difficulties of designing a broadband reflection standard in TRL calibration due to the large distance between probing pad and the interface with the DUT. The method presented is self-consistent and can be easily applied to S-parameter calculation and de-embedding of general discontinuities.
Keywords :
Calibration; Coplanar waveguides; Impedance; Millimeter wave communication; Millimeter wave measurements; Millimeter wave technology; Packaging; Probes; Reflection; Scattering parameters;
Conference_Titel :
ARFTG Conference Digest-Spring, 54th
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1999.327374