• DocumentCode
    1847697
  • Title

    A Novel De-embedding Technique for Millimeter-wave Package Characterization

  • Author

    Liang, Hongwei ; Laskar, Joy ; Hyslop, Mike ; Panicker, Ram

  • Author_Institution
    School of Electrical Engineering, Georgia Institute of Technology, 791, Atlantic Dr, N.W. Atlanta, GA 30332 (404)894-5174 Email: hwliang@ee.gatech.edu
  • Volume
    36
  • fYear
    2000
  • fDate
    Dec. 2000
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This paper describes a novel de-embedding technique for millimeter-wave BGA package characterization using accurate 2-port measurement. By calculating the S-matrix of the discontinuity between the probes and the DUT, the procedure can overcome the difficulties of designing a broadband reflection standard in TRL calibration due to the large distance between probing pad and the interface with the DUT. The method presented is self-consistent and can be easily applied to S-parameter calculation and de-embedding of general discontinuities.
  • Keywords
    Calibration; Coplanar waveguides; Impedance; Millimeter wave communication; Millimeter wave measurements; Millimeter wave technology; Packaging; Probes; Reflection; Scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 54th
  • Conference_Location
    Atlanta, GA, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1999.327374
  • Filename
    4120076