• DocumentCode
    1847773
  • Title

    Point sampling with uniformly distributed lines

  • Author

    Rovira, J. ; Wonka, P. ; Castro, F. ; Sbert, M.

  • Author_Institution
    Inst. d´´Informatica i Aplicacions, Univ. de Girona, Spain
  • fYear
    2005
  • fDate
    20-21 June 2005
  • Firstpage
    109
  • Lastpage
    118
  • Abstract
    In this paper we address the problem of extracting representative point samples from polygonal models. The goal of such a sampling algorithm is to find points that are evenly distributed. We propose star-discrepancy as a measure for sampling quality and propose new sampling methods based on global line distributions. We investigate several line generation algorithms including an efficient hardware-based sampling method. Our method contributes to the area of point-based graphics by extracting points that are more evenly distributed than by sampling with current algorithms.
  • Keywords
    computational geometry; feature extraction; image sampling; solid modelling; feature extraction; global line distribution; line generation algorithm; point sampling; polygonal model; realism; star-discrepancy; three-dimensional graphics; Carbon capture and storage; Computer graphics; Data structures; Hardware; Power generation; Rendering (computer graphics); Robustness; Sampling methods; Topology; Water storage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Point-Based Graphics, 2005. Eurographics/IEEE VGTC Symposium Proceedings
  • ISSN
    1511-7813
  • Print_ISBN
    3-905673-20-7
  • Type

    conf

  • DOI
    10.1109/PBG.2005.194071
  • Filename
    1500325