Title :
Mode excitation by a line source in a parallel-plate waveguide filled with a pair of parallel double-negative and double-positive slabs
Author :
Alu, A. ; Engheta, N.
Author_Institution :
Dept. of Electr. & Syst. Eng., Pennsylvania Univ., Philadelphia, PA, USA
Abstract :
In this paper, we investigate theoretically the excitation of modes by a line source, as well as their modal structure and dispersion, in a parallel-plate waveguide that is filled with a pair of parallel slabs; one being a lossless "double-negative (DNG)" material and the other being a lossless conventional "double-positive (DPS)" medium. Previously, we have shown that such "conjugate" pairing of DNG and DPS materials may lead to reduction of size in one-dimensional cavity resonators and waveguides. The analysis presented here describes the proper modes in such a 1-D parallel plate waveguide, and reveals the possibility of no cut-off thickness for this class of parallel-plate waveguides, which implies that a proper TE or TM mode may always be excited in such a waveguide independent of the overall thickness of the waveguide. The excitation of guided modes by a line source and their power-flow peculiarities are discussed, and the analogy to the concept of "open 1-D cavity" in such a waveguide is mentioned. Some of the interesting features and physical insights regarding the power flow in these guided modes will be presented.
Keywords :
cavity resonators; mode matching; parallel plate waveguides; waveguide theory; double-negative slabs; double-positive slabs; line source; lossless material; modal dispersion; modal structure; mode excitation; one-dimensional waveguide; parallel slabs; parallel-plate waveguide; perfectly conducting plates; power-flow peculiarities; Cavity resonators; Composite materials; Conducting materials; Electromagnetic waveguides; Load flow; Slabs; Systems engineering and theory; Tellurium; Uniform resource locators; Waveguide theory;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2003. IEEE
Conference_Location :
Columbus, OH, USA
Print_ISBN :
0-7803-7846-6
DOI :
10.1109/APS.2003.1219861