Title :
Why are Non-Linear Microwave Systems Measurements so Involved?
Author :
Rolain, Yves ; van Moer, Wendy ; Vandersteen, Gerd ; Schoukens, Johan
Author_Institution :
Vrije Universiteit Brussel, dept ELEC, Pleinlaan,2 B-1050 Brussel (Belgium)
Abstract :
Performing nonlinear measurements on microwave devices is a complex task. This paper introduces step by step the key concepts that make the difference between linear S-parameter measurements and nonlinear measurements. The main goal here is to make nonlinear measurements more accessible to the practicing microwave engineer.
Keywords :
Bandwidth; Convolution; Frequency; Instruments; Linear systems; Measurement techniques; Microwave devices; Microwave measurements; Performance evaluation; Power system modeling;
Conference_Titel :
ARFTG Conference Digest-Spring, 55th
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.2000.327392
