Component tolerance and circuit performance: a case study

Author

White, Robert V.

Author_Institution

AT&T Bell Lab., Mesquite, TX, USA

fYear

1993

fDate

7-11 Mar 1993

Firstpage

922

Lastpage

927

Abstract

The author presents a continuation of work presented at APEC 1992 (see p.28-35), in which a simple circuit was simulated to predict yield in the manufacturing process. The simulation results had some anomalies. This was because the component values were assumed to be uniformly distributed between the tolerance limits. The author updates that assumption, and uses normally distributed component values. Various simulations are run with varying component tolerance and quality levels. From the mean and variance of the simulated results, plots are made that show the specification limits that would have to be set to meet a given yield requirement

Keywords

digital simulation; electronic engineering computing; integrated circuit manufacture; quality control; statistical analysis; Monte Carlo simulation; circuit performance; component quality levels; component tolerance; manufacturing process yield; normally distributed component values; overcurrent detector circuit; Aerospace electronics; Aerospace engineering; Circuit optimization; Circuit testing; Computer aided software engineering; Costs; Detectors; Documentation; Monte Carlo methods; Research and development;

fLanguage

English

Publisher

ieee

Conference_Titel

Applied Power Electronics Conference and Exposition, 1993. APEC '93. Conference Proceedings 1993., Eighth Annual

Conference_Location

San Diego, CA

Print_ISBN

0-7803-0983-9

Type

conf

DOI

10.1109/APEC.1993.290679

Filename

290679