• DocumentCode
    1848023
  • Title

    Towards Automatic Grading of Nuclear Cataract

  • Author

    Huiqi Li ; Joo Hwee Lim ; Jiang Liu ; Tien Yin Wong

  • Author_Institution
    Infocomm Res., Singapore
  • fYear
    2007
  • fDate
    22-26 Aug. 2007
  • Firstpage
    4961
  • Lastpage
    4964
  • Abstract
    Objective quantification of lens images is essential for cataract assessment and treatment. In this paper, bottom-up and top-down strategies are combined to detect the lens contour from the slit-lamp images. The center of the lens is localized by horizontal and vertical intensity profile clustering and the lens contour is estimated by fitting an ellipse. A modified active shape model (ASM) is further applied to detect the contour of the lens. The average intensity inside the lens is employed as the indicator of nuclear opacity. The relationship between our automated nuclear cataract assessment and the clinical grading is analyzed. The preliminary study of forty images shows that the difference between automatic grading and clinical grading is acceptable.
  • Keywords
    bio-optics; biomedical optical imaging; curve fitting; edge detection; image classification; medical image processing; opacity; pattern clustering; photography; vision defects; automatic nuclear cataract grading; bottom-up methods; elliptical fitting; horizontal intensity profile clustering; image classification; lens contour detection; modified active shape model; nuclear opacity; objective lens image quantification; slit-lamp photographic images; top-down methods; vertical intensity profile clustering; Active shape model; Biomedical imaging; Blindness; Image analysis; Lab-on-a-chip; Lenses; Lighting; Optical design; Software design; Subscriptions; Accommodation, Ocular; Automation; Cataract; Drug Combinations; Humans; Image Processing, Computer-Assisted; Lens, Crystalline; Peroxides; Urea;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
  • Conference_Location
    Lyon
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-0787-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.2007.4353454
  • Filename
    4353454