Accuracy Evaluation of On-Wafer Load-Pull Measurements

The paper investigates the residual uncertainties effects in on-wafer load pull test sets. After the systematic error correction, based on traditional error-box model, the residual uncertainties on absolute power levels measurements can dramatically affect the accuracy of typical non-linear parameters such as power added efficiency, intermodulation distortion and output power levels for different load conditions. The main causes of residual errors are highlighted, a detailed theoretical analysis is given and the uncertainties effects experimentally evaluated.