Fourth and higher order small perturbation solution for scattering from dielectric rough surfaces

The small perturbation method (SPM) for scattering from a rough surface involves a perturbation series in surface height for scattered fields. In this paper, the systematic procedure is applied to construct a complete, recursive, and arbitrary order solution for scattered fields in the SPM method. Sample results from the fourth order theory are presented in terms of the fourth-order reflection coefficient correction The fourth order solution also allows computation of backscattered cross-polarized fields at sixth order, and the fourth order emitted power from a rough surface for passive remote sensing analysis.