Title :
Fourth and higher order small perturbation solution for scattering from dielectric rough surfaces
Author :
Demir, M.A. ; Johnson, J.T.
Author_Institution :
ElectroScience Lab., Ohio State Univ., Columbus, OH, USA
Abstract :
The small perturbation method (SPM) for scattering from a rough surface involves a perturbation series in surface height for scattered fields. In this paper, the systematic procedure is applied to construct a complete, recursive, and arbitrary order solution for scattered fields in the SPM method. Sample results from the fourth order theory are presented in terms of the fourth-order reflection coefficient correction The fourth order solution also allows computation of backscattered cross-polarized fields at sixth order, and the fourth order emitted power from a rough surface for passive remote sensing analysis.
Keywords :
backscatter; electromagnetic wave scattering; perturbation techniques; rough surfaces; arbitrary order solution; backscattered cross-polarized fields; dielectric rough surface; electromagnetic waves scattering; fourth order solution; higher order solution; isotropic Gaussian spectrum; perturbation series; scattered fields; small perturbation method; surface height; Dielectrics; Laboratories; Perturbation methods; Polarization; Reflection; Rough surfaces; Scanning probe microscopy; Scattering; Surface roughness; Tensile stress;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2003. IEEE
Conference_Location :
Columbus, OH, USA
Print_ISBN :
0-7803-7846-6
DOI :
10.1109/APS.2003.1219874
