DocumentCode
1848367
Title
Semi-supervised metric learning VIA topology representation
Author
Wang, Q.Y. ; Yuen, P.C. ; Feng, G.C.
Author_Institution
Sch. of Math. & Comput. Sci., Sun Yat-Sen Univ., Guangzhou, China
fYear
2012
fDate
27-31 Aug. 2012
Firstpage
639
Lastpage
643
Abstract
Learning an appropriate distance metric is a critical problem in pattern recognition. This paper addresses the problem in semi-supervised metric learning and proposes a new regularized semi-supervised metric learning (RSSML) method using local topology and triplet constraint. Our regularizer is designed and developed based on local topology, which is represented by local neighbors from the local smoothness, cluster (region density) and manifold information point of view. The regularizer is then combined with the large margin hinge loss on triplet constraint. We have implemented experiments on classification using UCI data set and KTH human action data set to evaluate the proposed method. Experimental results show that the proposed method outperforms state-of-the-art semi-supervised distance metric learning algorithms.
Keywords
data handling; learning (artificial intelligence); pattern recognition; topology; RSSML; UCI data set; pattern recognition; regularized semisupervised metric learning; topology representation; Error analysis; Euclidean distance; Fasteners; Kernel; Manifolds; Topology; cluster; density; manifold; semi-supervised metric learning;
fLanguage
English
Publisher
ieee
Conference_Titel
Signal Processing Conference (EUSIPCO), 2012 Proceedings of the 20th European
Conference_Location
Bucharest
ISSN
2219-5491
Print_ISBN
978-1-4673-1068-0
Type
conf
Filename
6333904
Link To Document