Title :
Minimal test set generation for fault diagnosis in R-valued PLAs
Author :
Nagata, Yasunori ; Miller, D. Michael ; Mukaidono, Masao
Author_Institution :
Dept. of Electrical & Electr. Eng., Ryukyus Univ., Okinawa, Japan
Abstract :
For fault diagnosis in R-valued PLAs (R⩾2), we construct a test table with rows of test vectors each giving activated product lines and normal output values of the programmed functions. Test vector generation for constructing the test table is based on product-oriented test generation which was proposed by Min and Fujiwara for binary PLAs. The number of test vectors is exactly k·(n·R-1) where k is the number of product lines in an R-valued n variable PLA. The procedure to construct the test table is based on a hash method on the generated tests. By combining tests in the table, fault diagnosis of PLA can be performed efficiently
Keywords :
fault diagnosis; logic testing; multivalued logic; programmable logic arrays; PLAs; fault diagnosis; multivalued logic; test table; test vector generation; Fault diagnosis; Programmable logic arrays; Testing;
Conference_Titel :
Multiple-Valued Logic, 1998. Proceedings. 1998 28th IEEE International Symposium on
Conference_Location :
Fukuoka
Print_ISBN :
0-8186-8371-6
DOI :
10.1109/ISMVL.1998.679273