Title :
Application of Weibull distribution for high temperature breakdown data
Author :
Raju, Govinda ; Katebian, A. ; Jafr, S.Z.
Author_Institution :
Dept. of Electr. & Comput. Eng., Windsor Univ., Ont., Canada
Abstract :
The breakdown electric field strength of high temperature polymer materials depends upon several factors, the measured values exhibiting a statistical distribution. To apply statistical methods the population size of breakdown data has to be sufficiently large. Though studies have been conducted on breakdown field strength of polymers at room temperature, yielding a large number of data, such studies at high temperatures are relatively few due to practical limitations. This study is devoted to the investigation of breakdown field strength of a number of polymer films at high temperatures using a new experimental set up in which large population data is obtained in a relatively short time
Keywords :
Weibull distribution; electric breakdown; electric strength; high-temperature effects; organic insulating materials; polymer films; Weibull distribution; breakdown electric field strength; breakdown field strength; high temperature breakdown data; high temperature polymer materials; high temperatures; polymer films; population size; statistical distribution; statistical methods; Dielectric breakdown; Dielectric materials; Dielectric measurements; Dielectrics and electrical insulation; Electric breakdown; Electrodes; Polymers; Temperature distribution; Testing; Weibull distribution;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2001 Annual Report. Conference on
Conference_Location :
Kitchener, Ont.
Print_ISBN :
0-7803-7053-8
DOI :
10.1109/CEIDP.2001.963514