DocumentCode :
1848551
Title :
Enamelled twisted pairs specimens: quasi-square voltage rise time influence on life-tests values
Author :
Guastavino, F. ; Coletti, G. ; Cerutti, B.
Author_Institution :
Electr. Eng. Dept., Univ. of Genova, Italy
fYear :
2001
fDate :
2001
Firstpage :
197
Lastpage :
200
Abstract :
The continuous progress in electronic switches employed in electronic drives has brought higher performances and, potentially, new problems especially from the electric motor insulation systems point of view. In fact the PWM inverter waveforms, characterised by voltage drops at high frequencies, can influence the lifetimes of these insulating systems in a different way with respect to the traditional sinusoidal voltages. In this work the behaviour of enamelled copper wires subjected to quasi-square voltages is studied, particularly the attention is focused on the influence of the voltage rise time on the ageing process. Partial discharge (PD) monitoring during the tests enables us to explain the obtained results
Keywords :
ageing; copper; insulated wires; insulation testing; life testing; machine insulation; machine windings; partial discharge measurement; Cu; PD monitoring; PWM inverter waveforms; ageing process; electric motor insulation; enamelled Cu wires; enamelled twisted pairs specimens; insulating systems; life-tests values; partial discharge monitoring; quasi-square voltages; voltage rise time influence; Aging; Copper; Dielectrics and electrical insulation; Electric motors; Frequency; Partial discharges; Pulse width modulation inverters; Switches; Voltage; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2001 Annual Report. Conference on
Conference_Location :
Kitchener, Ont.
Print_ISBN :
0-7803-7053-8
Type :
conf
DOI :
10.1109/CEIDP.2001.963519
Filename :
963519
Link To Document :
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