Title :
A New Technique for Low-Jitter Measurements Using Equivalent-Time Sampling Oscilloscopes
Author_Institution :
Tektronix, Inc., Sampling Oscilloscopes, Beaverton, OR 97077 USA
Abstract :
A new timebase technology for equivalent-time sampling oscilloscopes is presented. The technology is based on the qualification of a high-Q resonator with traditional analog signal processing, and provides a startable oscillator for generating trigger-to-strobe delays with excellent long term jitter performance.
Keywords :
Circuits; Degradation; Delay; Instruments; Jitter; Oscillators; Oscilloscopes; Sampling methods; Signal processing; Signal sampling;
Conference_Titel :
ARFTG Conference Digest-Fall, 56th
Conference_Location :
Boulder, AZ, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.2000.327422
