Title :
An Examination Of Feedback Bridging Faults In Digital CMOS circuits
Author_Institution :
University of Erlangen-Nurnberg
Keywords :
CMOS digital integrated circuits; Circuit faults; Circuit simulation; Circuit synthesis; Electric resistance; Feedback circuits; Inverters; Libraries; Semiconductor device modeling; Threshold voltage;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
IEEE
Print_ISBN :
0-7803-1281-3
