• DocumentCode
    1848822
  • Title

    Evaluating and expressing uncertainty in complex S-parameter measurements

  • Author

    Ridler, Nick M. ; Salter, Martin J.

  • Author_Institution
    Centre for Electromagnetic and Time Metrology, National Physical Laboratory, Teddington, Middlesex, TW11 0LW, United Kingdom
  • Volume
    38
  • fYear
    2000
  • fDate
    Nov. 2000
  • Firstpage
    1
  • Lastpage
    13
  • Abstract
    This paper presents methods for evaluating and expressing the uncertainty associated with complex S-parameter measurements. The methods are based on internationally recommended guidelines [1] with extensions to accommodate the complex nature of the measurands. The treatment of measurements of both one-port and multi-port devices is presented.
  • Keywords
    Arithmetic; Electromagnetic measurements; Gaussian distribution; Guidelines; Laboratories; Measurement uncertainty; Metrology; Reflection; Scattering parameters; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Fall, 56th
  • Conference_Location
    Boulder, AZ, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.2000.327429
  • Filename
    4120128
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1848822