Title :
Evaluating and expressing uncertainty in complex S-parameter measurements
Author :
Ridler, Nick M. ; Salter, Martin J.
Author_Institution :
Centre for Electromagnetic and Time Metrology, National Physical Laboratory, Teddington, Middlesex, TW11 0LW, United Kingdom
Abstract :
This paper presents methods for evaluating and expressing the uncertainty associated with complex S-parameter measurements. The methods are based on internationally recommended guidelines [1] with extensions to accommodate the complex nature of the measurands. The treatment of measurements of both one-port and multi-port devices is presented.
Keywords :
Arithmetic; Electromagnetic measurements; Gaussian distribution; Guidelines; Laboratories; Measurement uncertainty; Metrology; Reflection; Scattering parameters; Time measurement;
Conference_Titel :
ARFTG Conference Digest-Fall, 56th
Conference_Location :
Boulder, AZ, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.2000.327429
