DocumentCode
1848871
Title
RF materials characterization metrology at NBS/NIST: past and recent work, future directions and challenges
Author
Baker-Jarvis, James
Author_Institution
Radio-Frequency Technol. Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fYear
2001
fDate
2001
Firstpage
265
Lastpage
268
Abstract
We summarize the RF materials characterization programs at NBS/NIST. We also project what we believe will be the most important measurement problems for the future
Keywords
dielectric measurement; magnetic variables measurement; measurement standards; reviews; NBS/NIST; RF materials characterization metrology; measurement problems; review; Conducting materials; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Magnetic materials; Metrology; NIST; Permeability; Permittivity measurement; Radio frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 2001 Annual Report. Conference on
Conference_Location
Kitchener, Ont.
Print_ISBN
0-7803-7053-8
Type
conf
DOI
10.1109/CEIDP.2001.963535
Filename
963535
Link To Document