DocumentCode
1848872
Title
Lumped-Element Models for On-Wafer Calibration
Author
Walker, David K. ; Kaiser, Raian F. ; Williams, Dylan F. ; Coakley, Kevin J.
Author_Institution
National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80303, Ph: [+1](303)497-5490 Fax: [+1](303)497-3970 E-mail: dwalker@boulder.nist.gov
Volume
38
fYear
2000
fDate
Nov. 2000
Firstpage
1
Lastpage
4
Abstract
We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models that are complicated enough to replicate the actual electrical behavior of the lumped standards, but do not have more degrees of freedom than absolutely necessary.
Keywords
Calibration; Extrapolation; Frequency measurement; Impedance; Measurement standards; NIST; Noise measurement; Performance evaluation; Polynomials; Resistors;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Fall, 56th
Conference_Location
Boulder, AZ, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.2000.327431
Filename
4120130
Link To Document