Title :
Lumped-Element Models for On-Wafer Calibration
Author :
Walker, David K. ; Kaiser, Raian F. ; Williams, Dylan F. ; Coakley, Kevin J.
Author_Institution :
National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80303, Ph: [+1](303)497-5490 Fax: [+1](303)497-3970 E-mail: dwalker@boulder.nist.gov
Abstract :
We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models that are complicated enough to replicate the actual electrical behavior of the lumped standards, but do not have more degrees of freedom than absolutely necessary.
Keywords :
Calibration; Extrapolation; Frequency measurement; Impedance; Measurement standards; NIST; Noise measurement; Performance evaluation; Polynomials; Resistors;
Conference_Titel :
ARFTG Conference Digest-Fall, 56th
Conference_Location :
Boulder, AZ, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.2000.327431
