Title :
Broadband dielectric metrology for polymer composite films
Author :
Obrzut, J. ; Noda, N. ; Nozak, R.
Author_Institution :
Polymers Div., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
We evaluated the dielectric permittivity and relaxation in polymer composite films filled with ferroelectric ceramics. Such materials are currently being developed for power-ground decoupling in electronic circuits operating at microwave frequencies. In order to extend the measurements to the microwave range, we developed an appropriate expression for the input admittance of a thin film capacitance terminating a coaxial line. The theoretical model treats the capacitance as a distributed network and correlates the network scattering parameter with complex permittivity of the specimen. The method eliminates the systematic uncertainties of the lumped element approximations and is suitable for high frequency characterization of low impedance substrates with high value of the dielectric constant. The complex permittivity was measured at frequencies of 100 Hz to 10 GHz for films 100 μm thick, having the dielectric constant of 4 to 40, and was fitted to a dielectric model expressed as a combination of Havriliak-Negami functions. An intrinsic high frequency relaxation process has been identified. It was found that the position of the loss peak depends on the relaxation of polymer matrix, while its magnitude is amplified by the permittivity of the ferroelectric component
Keywords :
composite materials; dielectric relaxation; dielectric thin films; ferroelectric ceramics; filled polymers; high-frequency effects; microwave measurement; permittivity measurement; polymer films; 100 Hz to 10 GHz; 100 micron; BaTiO3; Havriliak-Negami functions; broadband dielectric metrology; coaxial line; complex permittivity; dielectric constant; dielectric permittivity; dielectric relaxation; distributed network; electronic circuits; ferroelectric ceramics; ferroelectric component; input admittance; microwave frequencies; network scattering parameter; polymer composite films; polymer matrix; power-ground decoupling; thin film capacitance; Capacitance; Dielectric measurements; Dielectric substrates; Dielectric thin films; Ferroelectric films; Ferroelectric materials; Frequency; Metrology; Permittivity measurement; Polymer films;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2001 Annual Report. Conference on
Conference_Location :
Kitchener, Ont.
Print_ISBN :
0-7803-7053-8
DOI :
10.1109/CEIDP.2001.963536