DocumentCode :
1848983
Title :
Methods of discriminating partial discharge and noise for power cable lines
Author :
Chen, M. ; Urano, K. ; Sekiguchi, Y. ; Komeda, H. ; Asai, S. ; Jinno, A. ; Fukunaga, S.
Author_Institution :
Sumitomo Electr. Ind. Ltd., Osaka, Japan
fYear :
2001
fDate :
2001
Firstpage :
285
Lastpage :
289
Abstract :
This paper describes a new multiple means of discriminating partial discharge (PD) and noise for power cable lines, which is applied in some newly developed PD auto-measuring systems, not only for the PD measurement in laboratory, but also for the after-laying testing of power cable line on-site. Discrimination of PD and noise can be divided into two kinds of PD judgment. First, the judgment is executed automatically based on multiple logic gates: f-gate for frequency, n-gate for pulse count rate, q-gate for pulse magnitude, φ-gate for PD phase position, t-gate for continuous time, set logically in serial or in parallel. Second, the signals can be recognized by their pattern distributions: neural network recognition is based on the φ-q-n pattern; multiple frequency recognition is based on f-q-t pattern; and statistical source location pattern is based on x-q-t pattern. Satisfactory discrimination of high accuracy has been obtained through applying the measuring systems using the method in several PD measurements on-site
Keywords :
electric noise measurement; logic gates; neural nets; partial discharge measurement; pattern recognition; power cable testing; φ-gate; after-laying testing; auto-measuring systems; continuous time; f-gate; frequency; multiple frequency recognition; multiple logic gates; n-gate; neural network recognition; noise; partial discharge; pattern distributions; phase position; power cable lines; pulse count rate; pulse magnitude; q-gate; statistical source location pattern; t-gate; Frequency; Laboratories; Logic gates; Noise measurement; Partial discharge measurement; Partial discharges; Pattern recognition; Power cables; Power measurement; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2001 Annual Report. Conference on
Conference_Location :
Kitchener, Ont.
Print_ISBN :
0-7803-7053-8
Type :
conf
DOI :
10.1109/CEIDP.2001.963540
Filename :
963540
Link To Document :
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